Equipment | Description | Application | Photo |
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Scanning Electron Microscope (SEM) | SEM provides high-resolution imaging of sample surfaces by scanning them with an electron beam. It is essential for material characterization and failure analysis. | - Surface morphology analysis in nanotechnology
- Failure analysis in engineering materials
- Biological specimen imaging
- Particle size and composition analysis•
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Transmission Electron Microscopy (TEM) | TEM offers ultra-high-resolution imaging of thin samples, allowing visualization at the atomic scale. It is widely used in materials science and life sciences. | - Structural analysis of nanomaterials
- Cellular and molecular biology research
- Semiconductor defect analysis
- Crystal structure determination
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Contact:
Mr. Essam Shabaan Mohamed Attia, Senior Chemist